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Towards cube-sized compute nodes: Advanced packaging concepts enabling extreme 3D integration
(2017)2017 IEEE International Electron Devices Meeting (IEDM)Conference Paper -
Analysis and Comparative Evaluation of Stacked-Transistor Half-Bridge Topologies Implemented with 14 nm Bulk CMOS Technology
(2017)2017 IEEE 18th Workshop on Control and Modeling for Power Electronics (COMPEL)Conference Paper