Failure-relevant abnormal events in power inverters considering measured IGBT module temperature inhomogeneities

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Autor(in)
Perpina, X.
Castellazzi, A.
Piton, M.
Mermet-Guyennet, M.
Millan, J.
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Datum
2007
Typ
    Conference Paper
Publikationsstatus
published
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Zeitschrift / Serie
Microelectronics Reliability
Band
47(9-11)
Seiten / Artikelnummer
1784 - 1789
Verlag
Elsevier
Konferenz
18th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Bordeaux, France, October 8-12, 2007
Organisationseinheit
03228 - Fichtner, Wolfgang  
Anmerkungen
Received 9 July 2007. Available online 30 August 2007..
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