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dc.contributor.author
Perpina, X.
dc.contributor.author
Castellazzi, A.
dc.contributor.author
Piton, M.
dc.contributor.author
Mermet-Guyennet, M.
dc.contributor.author
Millan, J.
dc.date.accessioned
2017-06-08T17:59:31Z
dc.date.available
2017-06-08T17:59:31Z
dc.date.issued
2007
dc.identifier.issn
0026-2714
dc.identifier.issn
1872-941X
dc.identifier.other
10.1016/j.microrel.2007.07.071
dc.identifier.uri
http://hdl.handle.net/20.500.11850/8011
dc.language.iso
en
dc.publisher
Oxford Elsevier
dc.title
Failure-relevant abnormal events in power inverters considering measured IGBT module temperature inhomogeneities
dc.type
Conference Paper
ethz.journal.title
Microelectronics Reliability
ethz.journal.volume
47
ethz.journal.issue
9-11
ethz.journal.abbreviated
Microelectron. Reliab.
ethz.pages.start
1784
ethz.pages.end
1789
ethz.event
18th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
ethz.event.location
Arcachon, France
ethz.notes
Received 9 July 2007. Available online 30 August 2007..
ethz.identifier.wos
ethz.identifier.nebis
001933457
ethz.publication.place
Kidlington
ethz.publication.status
published
ethz.leitzahl
03228 - Fichtner, Wolfgang
ethz.leitzahl.certified
03228 - Fichtner, Wolfgang
ethz.date.deposited
2017-06-08T17:59:33Z
ethz.source
ECIT
ethz.identifier.importid
imp59364bbe8382324567
ethz.ecitpid
pub:18669
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-15T08:27:22Z
ethz.rosetta.lastUpdated
2020-02-14T05:00:35Z
ethz.rosetta.exportRequired
true
ethz.rosetta.versionExported
true
ethz.COinS
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