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dc.contributor.author
Molina-Lopez, Francisco
dc.contributor.author
Kinkeldei, T.
dc.contributor.author
Briand, D.
dc.contributor.author
Tröster, Gerhard
dc.contributor.author
De Rooij, Nicolaas F.
dc.date.accessioned
2017-06-11T04:36:44Z
dc.date.available
2017-06-11T04:36:44Z
dc.date.issued
2013
dc.identifier.issn
0021-8979
dc.identifier.issn
1089-7550
dc.identifier.other
10.1063/1.4829023
dc.identifier.uri
http://hdl.handle.net/20.500.11850/80149
dc.language.iso
en
dc.publisher
American Institute of Physics
dc.title
Theoretical and experimental study of the bending influence on the capacitance of interdigitated micro-electrodes patterned on flexible substrates
dc.type
Journal Article
ethz.journal.title
Journal of Applied Physics
ethz.journal.volume
114
ethz.journal.abbreviated
J. Appl. Physi.
ethz.pages.start
174907
ethz.size
7 p.
ethz.identifier.nebis
000037502
ethz.publication.place
Melville, NY
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02634 - Institut für Elektronik / Institute for Electronics::03388 - Tröster, Gerhard (emeritus)
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::02634 - Institut für Elektronik / Institute for Electronics::03388 - Tröster, Gerhard (emeritus)
ethz.date.deposited
2017-06-11T04:38:45Z
ethz.source
ECIT
ethz.identifier.importid
imp593651987f4a022299
ethz.ecitpid
pub:125610
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-13T13:05:56Z
ethz.rosetta.lastUpdated
2021-02-14T11:19:59Z
ethz.rosetta.versionExported
true
ethz.COinS
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