The analysis of quartz c-axis fabrics using a modified optical microscope
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Date
2007Type
- Journal Article
ETH Bibliography
yes
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Publication status
publishedExternal links
Journal / series
Journal of MicroscopyVolume
Pages / Article No.
Publisher
BlackwellSubject
electron backscatter diffraction; microstructure; optical microscopy; orientation distribution; polarized light; texture goniometryOrganisational unit
03392 - Burg, Jean-Pierre (emeritus)
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ETH Bibliography
yes
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