TCAD-based DLTS simulation for analysis of extended defects
Metadata only
Date
2014-01-01Type
- Journal Article
Publication status
publishedExternal links
Journal / series
Physica Status Solidi AVolume
Pages / Article No.
Publisher
WileySubject
Deep level transient spectroscopy (DLTS); Dislocation loops; Extended defects; Leakage currents; Technology computer aided design (TCAD)Notes
Article first published online 9 January 2014.More
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