TCAD-based DLTS simulation for analysis of extended defects
dc.contributor.author
Scheinemann, Artur
dc.contributor.author
Schenk, Andreas
dc.date.accessioned
2017-06-11T05:26:33Z
dc.date.available
2017-06-11T05:26:33Z
dc.date.issued
2014-01-01
dc.identifier.issn
1862-6300
dc.identifier.issn
1862-6319
dc.identifier.issn
0031-8965
dc.identifier.issn
1521-396X
dc.identifier.other
10.1002/pssa.201300233
dc.identifier.uri
http://hdl.handle.net/20.500.11850/80982
dc.language.iso
en
dc.publisher
Wiley
dc.subject
Deep level transient spectroscopy (DLTS)
dc.subject
Dislocation loops
dc.subject
Extended defects
dc.subject
Leakage currents
dc.subject
Technology computer aided design (TCAD)
dc.title
TCAD-based DLTS simulation for analysis of extended defects
dc.type
Journal Article
ethz.journal.title
Physica Status Solidi A
ethz.journal.volume
211
ethz.journal.issue
1
ethz.journal.abbreviated
Phys. Status Solidi A
ethz.pages.start
136
ethz.pages.end
142
ethz.notes
Article first published online 9 January 2014.
ethz.identifier.wos
ethz.identifier.scopus
ethz.identifier.nebis
001365038
ethz.publication.place
Berlin
ethz.publication.status
published
ethz.date.deposited
2017-06-11T05:27:58Z
ethz.source
ECIT
ethz.identifier.importid
imp593651a9d356742787
ethz.ecitpid
pub:127248
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-17T09:59:02Z
ethz.rosetta.lastUpdated
2021-02-14T11:24:25Z
ethz.rosetta.versionExported
true
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