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dc.contributor.author
Cheng, Jun
dc.contributor.author
VandeVondele, Joost
dc.contributor.author
Sprik, Michiel
dc.date.accessioned
2017-06-11T05:57:21Z
dc.date.available
2017-06-11T05:57:21Z
dc.date.issued
2014-03
dc.identifier.issn
1932-7455
dc.identifier.issn
1932-7447
dc.identifier.other
10.1021/jp500769q
dc.identifier.uri
http://hdl.handle.net/20.500.11850/81458
dc.language.iso
en
dc.publisher
American Chemical Society
dc.title
Identifying Trapped Electronic Holes at the Aqueous TiO2 Interface
dc.type
Journal Article
ethz.journal.title
The Journal of Physical Chemistry C
ethz.journal.volume
118
ethz.journal.issue
10
ethz.journal.abbreviated
J. phys. chem., C
ethz.pages.start
5437
ethz.pages.end
5444
ethz.notes
Received 22 January 2014, Revised 21 February 2014, Published online 24 February 2014.
ethz.identifier.wos
ethz.identifier.scopus
ethz.identifier.nebis
005283485
ethz.publication.place
Washington, DC
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich, direkt::00012 - Lehre und Forschung, direkt::00007 - Departemente, direkt::02160 - Departement Materialwissenschaft / Department of Materials::03947 - VandeVondele, Joost (ehemalig)
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich, direkt::00012 - Lehre und Forschung, direkt::00007 - Departemente, direkt::02160 - Departement Materialwissenschaft / Department of Materials::03947 - VandeVondele, Joost (ehemalig)
ethz.date.deposited
2017-06-11T05:58:59Z
ethz.source
ECIT
ethz.identifier.importid
imp593651b4385cc21418
ethz.ecitpid
pub:128243
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-20T17:24:03Z
ethz.rosetta.lastUpdated
2020-02-14T13:24:13Z
ethz.rosetta.versionExported
true
ethz.COinS
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