A Cost-Effective Atomic Force Microscope for Undergraduate Control Laboratories
Jones, C. N.
This paper presents a simple, cost-effective and robust Atomic Force Microscope (AFM), which has been purpose designed and built for use as a teaching aid in undergraduate controls labs. The guiding design principle is to have all components be open and visible to the students and as a result, the inner functioning of the microscope is clear to see. All but one part are off the shelf, and assembly time is less than two days, which makes the microscope a robust instrument, that is readily handled by the students with little chance of damage. While the scanning resolution is nowhere near that of a commercial instrument, it is more than sufficient to take interesting scans of micrometer-scaled objects Show more
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Journal / seriesTechnical Report
PublisherETH Zürich, Automatic Control Laboratory
Organisational unit03416 - Morari, Manfred (emeritus)
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