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dc.contributor.author
Goletti, Claudio
dc.contributor.author
Fazi, Laura
dc.contributor.author
Hogan, Conor
dc.contributor.author
Persichetti, Luca
dc.contributor.author
Sgarlata, Anna
dc.contributor.author
Palummo, Maurizia
dc.contributor.author
Balzarotti, Adalberto
dc.date.accessioned
2017-06-11T07:17:41Z
dc.date.available
2017-06-11T07:17:41Z
dc.date.issued
2015-01
dc.identifier.issn
0370-1972
dc.identifier.issn
1521-3951
dc.identifier.other
10.1002/pssb.201350398
dc.identifier.uri
http://hdl.handle.net/20.500.11850/82871
dc.language.iso
en
dc.publisher
Wiley
dc.subject
Density functional theory
dc.subject
Oxidation
dc.subject
Reflectance anisotropy spectroscopy
dc.subject
Vicinal silicon surfaces
dc.title
Early oxidation stages of the strained Ge/Si(105) surface
dc.type
Journal Article
ethz.title.subtitle
A reflectance anisotropy spectroscopy study
ethz.journal.title
Physica Status Solidi B
ethz.journal.volume
252
ethz.journal.issue
1
ethz.pages.start
87
ethz.pages.end
94
ethz.notes
Received 16 December 2013, Revised 17 March 2014, Accepted 18 March 2014, Published online 2 May 2014.
ethz.identifier.scopus
ethz.identifier.nebis
001365301
ethz.publication.place
Berlin
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02160 - Dep. Materialwissenschaft / Dep. of Materials::03986 - Gambardella, Pietro / Gambardella, Pietro
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02160 - Dep. Materialwissenschaft / Dep. of Materials::03986 - Gambardella, Pietro / Gambardella, Pietro
ethz.date.deposited
2017-06-11T07:17:44Z
ethz.source
ECIT
ethz.identifier.importid
imp593651ce03b5698886
ethz.ecitpid
pub:130774
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-13T17:42:15Z
ethz.rosetta.lastUpdated
2020-02-14T13:31:09Z
ethz.rosetta.versionExported
true
ethz.COinS
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