Reading distance degradation mechanisms of near-field RFID devices
dc.contributor.author
Jacob, Peter
dc.contributor.author
Knecht, Willy
dc.contributor.author
Kunz, Albert
dc.contributor.author
Nicoletti, Giovanni
dc.contributor.author
Lautenschlager, Thomas
dc.contributor.author
Mondada, Moreno
dc.contributor.author
Pachoud, Damien
dc.date.accessioned
2017-06-11T08:42:19Z
dc.date.available
2017-06-11T08:42:19Z
dc.date.issued
2009-09
dc.identifier.issn
0026-2714
dc.identifier.issn
1872-941X
dc.identifier.other
10.1016/j.microrel.2009.06.012
dc.identifier.uri
http://hdl.handle.net/20.500.11850/84339
dc.language.iso
en
dc.publisher
Elsevier
dc.title
Reading distance degradation mechanisms of near-field RFID devices
dc.type
Conference Paper
ethz.journal.title
Microelectronics Reliability
ethz.journal.volume
49
ethz.journal.issue
9-11
ethz.journal.abbreviated
Microelectron. Reliab.
ethz.pages.start
1288
ethz.pages.end
1292
ethz.event
20th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
ethz.event.location
Arcachon, France
ethz.event.date
October 05-09, 2009
ethz.identifier.wos
ethz.identifier.nebis
001933457
ethz.publication.place
Kidlington
ethz.publication.status
published
ethz.date.deposited
2017-06-11T08:42:22Z
ethz.source
ECIT
ethz.identifier.importid
imp593651eac0a6868662
ethz.ecitpid
pub:133005
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-12T18:42:35Z
ethz.rosetta.lastUpdated
2024-02-01T21:50:10Z
ethz.rosetta.versionExported
true
ethz.COinS
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