Wavefront metrology measurements at SACLA by means of X-ray grating interferometry - Research Collection

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Author

Kayser, Yves

Rutishauser, Simon

Katayama, Tetsuo

Ohashi, Haruhiko

Kameshima, Takashi

Flechsig, Uwe

Yabashi, Makina

David, Christian

Date

2014

Type

Journal Article

Citations

Cited 12 times in Web of Science

ETH Bibliography

yes

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Publication status

published

External links

https://doi.org/10.1364/OE.22.009004

Journal / series

Optics Express

Volume

22(8)

Pages / Article No.

9004 - 9015

Publisher

Optical Society of America

Notes

.

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Citations

Cited 12 times in Web of Science

ETH Bibliography

yes

Altmetrics