Wavefront metrology measurements at SACLA by means of X-ray grating interferometry

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Author
Kayser, Yves
Rutishauser, Simon
Katayama, Tetsuo
Ohashi, Haruhiko
Kameshima, Takashi
Flechsig, Uwe
Yabashi, Makina
David, Christian
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Date
2014
Type
  • Journal Article
Publication status
published
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Journal / series
Optics Express
Volume
22(8)
Pages
9004 - 9015
Publisher
Optical Society of America
Notes
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Citations
Cited 12 times in Web of Science
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