Wavefront metrology measurements at SACLA by means of X-ray grating interferometry - Research Collection

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Author

Rutishauser, Simon

Katayama, Tetsuo

Ohashi, Haruhiko

Kameshima, Takashi

Yabashi, Makina

David, Christian

Date

2014

Type

Journal Article

Citations

Cited 19 times in Web of Science

ETH Bibliography

yes

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Publication status

published

External links

https://doi.org/10.1364/OE.22.009004

Journal / series

Optics Express

Volume

22(8)

Pages / Article No.

9004 - 9015

Publisher

Optical Society of America

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Citations

Cited 19 times in Web of Science

ETH Bibliography

yes

Altmetrics