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dc.contributor.author
Kayser, Yves
dc.contributor.author
Rutishauser, Simon
dc.contributor.author
Katayama, Tetsuo
dc.contributor.author
Ohashi, Haruhiko
dc.contributor.author
Kameshima, Takashi
dc.contributor.author
Flechsig, Uwe
dc.contributor.author
Yabashi, Makina
dc.contributor.author
David, Christian
dc.date.accessioned
2017-06-11T09:12:12Z
dc.date.available
2017-06-11T09:12:12Z
dc.date.issued
2014
dc.identifier.issn
1094-4087
dc.identifier.other
10.1364/OE.22.009004
dc.identifier.uri
http://hdl.handle.net/20.500.11850/84829
dc.language.iso
en
dc.publisher
Optical Society of America
dc.title
Wavefront metrology measurements at SACLA by means of X-ray grating interferometry
dc.type
Journal Article
ethz.journal.title
Optics Express
ethz.journal.volume
22
ethz.journal.issue
8
ethz.journal.abbreviated
Opt. express
ethz.pages.start
9004
ethz.pages.end
9015
ethz.notes
.
ethz.identifier.wos
ethz.identifier.nebis
001934332
ethz.publication.status
published
ethz.date.deposited
2017-06-11T09:16:57Z
ethz.source
ECIT
ethz.identifier.importid
imp593651f46336f96339
ethz.ecitpid
pub:133782
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-13T13:32:24Z
ethz.rosetta.lastUpdated
2018-08-02T14:22:47Z
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true
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