Scanning Probe Microscopy of Ferroelectric Domains near Phase Transitions
dc.contributor.author
Abplanalp, M.
dc.contributor.author
Zgonik, M.
dc.contributor.author
Günter, Peter
dc.contributor.editor
Alexe, Marin
dc.contributor.editor
Gruverman, Alexei
dc.date.accessioned
2017-06-11T09:32:24Z
dc.date.available
2017-06-11T09:32:24Z
dc.date.issued
2004
dc.identifier.isbn
3-540-20662-0
dc.identifier.issn
1434-4904
dc.identifier.other
10.1007/978-3-662-08901-9_7
dc.identifier.uri
http://hdl.handle.net/20.500.11850/85200
dc.language.iso
en
dc.publisher
Springer
dc.title
Scanning Probe Microscopy of Ferroelectric Domains near Phase Transitions
dc.type
Book Chapter
ethz.book.title
Nanoscale characterisation of ferroelectric materials : scanning probe microscopy approach
ethz.journal.title
Nanoscience and technology
ethz.pages.start
193
ethz.pages.end
220
ethz.identifier.nebis
004686015
ethz.publication.place
Berlin
ethz.publication.status
published
ethz.leitzahl
03255 - Günter, Peter
ethz.leitzahl.certified
03255 - Günter, Peter
ethz.date.deposited
2017-06-11T09:33:05Z
ethz.source
ECIT
ethz.identifier.importid
imp593651fbcbe7744974
ethz.ecitpid
pub:134308
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-20T17:20:09Z
ethz.rosetta.lastUpdated
2021-02-14T11:49:17Z
ethz.rosetta.versionExported
true
ethz.COinS
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Book Chapter [9052]