Higher Order Ferroic Switching Induced by Scanning Force Microscopy
dc.contributor.author
Abplanalp, M.
dc.contributor.author
Fousek, J.
dc.contributor.author
Günter, Peter
dc.date.accessioned
2017-06-11T09:48:20Z
dc.date.available
2017-06-11T09:48:20Z
dc.date.issued
2001
dc.identifier.issn
0031-9007
dc.identifier.issn
1079-7114
dc.identifier.other
10.1103/PhysRevLett.86.5799
dc.identifier.uri
http://hdl.handle.net/20.500.11850/85505
dc.language.iso
en
dc.publisher
American Physical Society
dc.title
Higher Order Ferroic Switching Induced by Scanning Force Microscopy
dc.type
Journal Article
ethz.journal.title
Physical Review Letters
ethz.journal.volume
86
ethz.journal.issue
25
ethz.journal.abbreviated
Phys. Rev. Lett.
ethz.pages.start
5799
ethz.pages.end
5802
ethz.notes
Received 21 November 2000, Published in the issue dated 18 June 2001.
ethz.identifier.nebis
000003868
ethz.publication.place
New York
ethz.publication.status
published
ethz.leitzahl
03255 - Günter, Peter
ethz.leitzahl.certified
03255 - Günter, Peter
ethz.date.deposited
2017-06-11T09:48:33Z
ethz.source
ECIT
ethz.identifier.importid
imp59365201b345611542
ethz.ecitpid
pub:134763
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-20T17:02:23Z
ethz.rosetta.lastUpdated
2023-02-06T12:28:24Z
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true
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