Retention in nonvolatile silicon transistors with an organic ferroelectric gate
Metadata only
Autor(in)
Alle anzeigen
Datum
2009-06Typ
- Journal Article
ETH Bibliographie
yes
Altmetrics
Publikationsstatus
publishedExterne Links
Zeitschrift / Serie
Applied Physics LettersBand
Seiten / Artikelnummer
Verlag
American Institute of PhysicsThema
Dielectric polarisation; Elemental semiconductors; Ferroelectric materials; Ferroelectric storage; MOSFET; Permittivity; Polymer blends; Random-access storage; Semiconductor storage; SiliconAnmerkungen
Received 10 February 2009, Accepted 28 May 2009, Published online 1 July 2009.ETH Bibliographie
yes
Altmetrics