Technological Lock-In Effects
A new Challenge for RF Health Risk Management?
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Date
2007Type
- Conference Paper
ETH Bibliography
yes
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Publication status
publishedBook title
EMC Zurich 2007. 18th International Zurich Symposium on Electromagnetic Compatibility : Munich, Germany, 24-28 September 2007Publisher
IEEEEvent
Organisational unit
03679 - Boutellier, Roman (emeritus)
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ETH Bibliography
yes
Altmetrics