Technological Lock-In Effects
Metadata only
Datum
2007Typ
- Conference Paper
ETH Bibliographie
yes
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Publikationsstatus
publishedBuchtitel
EMC Zurich 2007. 18th International Zurich Symposium on Electromagnetic Compatibility : Munich, Germany, 24-28 September 2007Verlag
IEEEKonferenz
Organisationseinheit
03679 - Boutellier, Roman (emeritus)
ETH Bibliographie
yes
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