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dc.contributor.author
Rohner, Nicolas
dc.contributor.author
Boutellier, Roman
dc.date.accessioned
2019-07-25T12:27:01Z
dc.date.available
2017-06-08T18:17:43Z
dc.date.available
2019-07-25T12:27:01Z
dc.date.issued
2007
dc.identifier.isbn
9783952328613
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/8715
dc.language.iso
en
en_US
dc.publisher
IEEE
en_US
dc.title
Technological Lock-In Effects
en_US
dc.type
Conference Paper
ethz.title.subtitle
A new Challenge for RF Health Risk Management?
en_US
ethz.book.title
EMC Zurich 2007. 18th International Zurich Symposium on Electromagnetic Compatibility : Munich, Germany, 24-28 September 2007
en_US
ethz.size
7 p.
en_US
ethz.event
18th International Zurich Symposium on Electromagnetic Compatibility
en_US
ethz.event.location
Zurich, Switzerland
en_US
ethz.event.date
September 24-28, 2007
en_US
ethz.publication.place
Piscataway, NJ
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02120 - Dep. Management, Technologie und Ökon. / Dep. of Management, Technology, and Ec.::03679 - Boutellier, Roman (emeritus)
en_US
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02120 - Dep. Management, Technologie und Ökon. / Dep. of Management, Technology, and Ec.::03679 - Boutellier, Roman (emeritus)
ethz.date.deposited
2017-06-08T18:17:58Z
ethz.source
ECIT
ethz.identifier.importid
imp59364bccae14186592
ethz.ecitpid
pub:19504
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2017-07-12T22:57:17Z
ethz.rosetta.lastUpdated
2019-07-25T12:27:07Z
ethz.rosetta.versionExported
true
ethz.COinS
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