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dc.contributor.author
Hoffmann, J.
dc.contributor.author
Gramse, G.
dc.contributor.author
Niegemann, J.
dc.contributor.author
Zeier, M.
dc.contributor.author
Kienberger, F.
dc.date.accessioned
2017-06-11T11:57:30Z
dc.date.available
2017-06-11T11:57:30Z
dc.date.issued
2014-07
dc.identifier.issn
0003-6951
dc.identifier.issn
1077-3118
dc.identifier.other
10.1063/1.4886965
dc.identifier.uri
http://hdl.handle.net/20.500.11850/88148
dc.language.iso
en
dc.publisher
American Institute of Physics
dc.title
Measuring low loss dielectric substrates with scanning probe microscopes
dc.type
Journal Article
ethz.journal.title
Applied Physics Letters
ethz.journal.volume
105
ethz.journal.issue
1
ethz.journal.abbreviated
Appl. phys. lett.
ethz.pages.start
013102
ethz.size
5p.
ethz.notes
Received 27 March 2014, Accepted 22 June 2014, Published online 7 July 2014.
ethz.identifier.wos
ethz.identifier.nebis
000038985
ethz.publication.place
Melville, NY
ethz.publication.status
published
ethz.date.deposited
2017-06-11T11:57:45Z
ethz.source
ECIT
ethz.identifier.importid
imp59365235b698b77247
ethz.ecitpid
pub:138739
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-17T10:27:54Z
ethz.rosetta.lastUpdated
2018-11-02T15:31:19Z
ethz.rosetta.versionExported
true
ethz.COinS
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