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dc.contributor.author
Wagner, Tino
dc.contributor.author
Reissner, Patrick
dc.contributor.author
Ruiz-Vargas, Carlos
dc.contributor.author
Gotsmann, Bernd
dc.contributor.author
Stemmer, Andreas
dc.date.accessioned
2017-06-11T12:02:19Z
dc.date.available
2017-06-11T12:02:19Z
dc.date.issued
2014
dc.identifier.uri
http://hdl.handle.net/20.500.11850/88325
dc.language.iso
en
dc.publisher
7th International Conference on Molecular Electronics (elecmol 2014)
dc.title
Kelvin probe force microscopy for local characterisation of active nanoelectronic devices
dc.type
Conference Poster
ethz.event
7th International Conference on Molecular Electronics (elecmol 2014)
ethz.event.location
Strasbourg, France
ethz.event.date
August 24-29, 2014
ethz.notes
.
ethz.publication.status
unpublished
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::03444 - Stemmer, Andreas / Stemmer, Andreas
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::03444 - Stemmer, Andreas / Stemmer, Andreas
ethz.date.deposited
2017-06-11T12:02:45Z
ethz.source
ECIT
ethz.identifier.importid
imp593652397a51828880
ethz.ecitpid
pub:138932
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-15T08:45:07Z
ethz.rosetta.lastUpdated
2018-11-02T15:34:07Z
ethz.rosetta.versionExported
true
ethz.COinS
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