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dc.contributor.author
Oehri, D.
dc.contributor.author
Lebedev, A.V.
dc.contributor.author
Lesovik, G.B.
dc.contributor.author
Blatter, G.
dc.date.accessioned
2017-06-11T12:26:35Z
dc.date.available
2017-06-11T12:26:35Z
dc.date.issued
2014-08
dc.identifier.issn
1098-0121
dc.identifier.issn
0163-1829
dc.identifier.issn
1550-235X
dc.identifier.issn
0556-2805
dc.identifier.issn
2469-9969
dc.identifier.issn
1095-3795
dc.identifier.issn
2469-9950
dc.identifier.other
10.1103/PhysRevB.90.075312
dc.identifier.uri
http://hdl.handle.net/20.500.11850/89284
dc.language.iso
en
dc.publisher
American Physical Society
dc.title
Projective versus weak measurement of charge in a mesoscopic conductor
dc.type
Journal Article
ethz.journal.title
Physical Review B
ethz.journal.volume
90
ethz.journal.issue
7
ethz.journal.abbreviated
Phys. Rev., B
ethz.pages.start
075312
ethz.size
12 p.
ethz.identifier.wos
ethz.identifier.nebis
001888782
ethz.publication.place
Ridge, NY
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02010 - Dep. Physik / Dep. of Physics::02511 - Institut für Theoretische Physik / Institute for Theoretical Physics::03571 - Sigrist, Manfred / Sigrist, Manfred::03369 - Blatter, Johann W. (emeritus) / Blatter, Johann W. (emeritus)
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02010 - Dep. Physik / Dep. of Physics::02511 - Institut für Theoretische Physik / Institute for Theoretical Physics::03571 - Sigrist, Manfred / Sigrist, Manfred::03369 - Blatter, Johann W. (emeritus) / Blatter, Johann W. (emeritus)
ethz.date.deposited
2017-06-11T12:27:14Z
ethz.source
ECIT
ethz.identifier.importid
imp5936524c4535524547
ethz.ecitpid
pub:140515
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-12T20:48:24Z
ethz.rosetta.lastUpdated
2022-03-28T13:07:42Z
ethz.rosetta.versionExported
true
ethz.COinS
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