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dc.contributor.author
Tüysüz, Arda
dc.contributor.author
Bosshard, Roman
dc.contributor.author
Kolar, Johann W.
dc.date.accessioned
2020-10-01T12:39:04Z
dc.date.available
2017-06-11T12:29:24Z
dc.date.available
2020-10-01T12:39:04Z
dc.date.issued
2014
dc.identifier.isbn
978-1-4799-2705-0
en_US
dc.identifier.other
10.1109/IPEC.2014.6869845
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/89426
dc.description.abstract
GaN power switches enable better switching characteristics compared to state-of-the-art power transistors that are widely used today. Due to their lower switching losses, GaN switches may lead to new horizons in key application areas of power electronics such as photovoltaic converters, high-speed electrical drives and contactless power transfer. However, this technology has not yet diffused fully into the industry. Therefore, today only limited experimental data is available on those switches. In this paper, a synchronous buck converter is designed using two 600 V, 15 A GaN GIT switches developed by Panasonic. Guidelines for an optimum PCB layout are given. Both electrical and calorimetric power loss measurements are shown. Finally, a comparison is made between the GIT and a similarly rated Si IGBT for high-speed electrical drive applications where the higher switching frequencies enabled by the use of GaN is shown to reduce the rotor losses in two typical types (slotted and slotless stator) of high-speed permanent-magnet electric machines.
en_US
dc.language.iso
en
en_US
dc.publisher
IEEE
en_US
dc.subject
GaN
en_US
dc.subject
Switching loss
en_US
dc.subject
Loss measurements
en_US
dc.subject
Motor drives
en_US
dc.title
Performance comparison of a GaN GIT and a Si IGBT for high-speed drive applications
en_US
dc.type
Conference Paper
dc.date.published
2014-08-07
ethz.book.title
2014 International Power Electronics Conference (IPEC-Hiroshima 2014 - ECCE ASIA)
en_US
ethz.pages.start
1904
en_US
ethz.pages.end
1911
en_US
ethz.event
7th International Power Electronics Conference (IPEC-Hiroshima 2014 - ECCE ASIA)
en_US
ethz.event.location
Hiroshima, Japan
en_US
ethz.event.date
May 18-21, 2014
en_US
ethz.publication.place
Piscataway, NJ
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::03573 - Kolar, Johann W. (emeritus) / Kolar, Johann W. (emeritus)
en_US
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::03573 - Kolar, Johann W. (emeritus) / Kolar, Johann W. (emeritus)
ethz.date.deposited
2017-06-11T12:29:37Z
ethz.source
ECIT
ethz.identifier.importid
imp5936524f685ee27937
ethz.ecitpid
pub:140685
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2017-07-12T17:01:34Z
ethz.rosetta.lastUpdated
2025-02-13T21:44:13Z
ethz.rosetta.versionExported
true
ethz.COinS
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