Test Circuits for Fast and Reliable Assessment of CDM Robustness of I/O stages

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Author
Stadler, W.
Esmark, K.
Reynders, K.
Zubeidat, M.
Graf, M.
Wilkening, W.
Willemen, J.
Qu, N.
Mettler, S.
Etherton, M.
Nuernbergk, D.
Wolf, H.
Gieser, H.
Soppa, W.
Heyn, V de.
Natarajan, M.
Groeseneken, G.
Morena, E.
Stella, R.
Andreini, A.
Litzenberger, M.
Pogany, D.
Gornik, E.
Foss, C.
Konrad, A.
Frank, M.
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Date
2003
Type
    Conference Paper
Publication status
published
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Book title
Electrical Overstress/Electrostatic Discharge Symposium proceedings 2003
Publisher
ESD Association
Event
Electrical Overstress/Electrostatic Discharge Symposium, Las Vegas, NV, USA, September 21-25, 2003
Organisational unit
03228 - Fichtner, Wolfgang  
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no
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