Characterization and Modeling of Transient Device Behavior under CDM ESD Stress

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Author
Willemen, J.
Andreini, A.
Heyn, V. De
Esmark, K.
Etherton, M.
Gieser, H.
Groeseneken, G.
Mettler, S.
Morena, E.
Qu, N.
Soppa, W.
Stadler, W.
Stella, R.
Wilkening, W.
Wolf , H.
Zullino, L.
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Date
2003
Type
    Conference Paper
Publication status
published
Book title
Electrical Overstress/Electrostatic Discharge Symposium proceedings 2003
Publisher
ESD Association
Event
Electrical Overstress/Electrostatic Discharge Symposium, 2003, Las Vegas, NV, USA, September 21-25, 2003
Organisational unit
03228 - Fichtner, Wolfgang  
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ETH Bibliography
no
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