Characterization and Modeling of Transient Device Behavior under CDM ESD Stress

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Author
Willemen, J.
Andreini, A.
Heyn, V. De
Esmark, K.
Etherton, M.
Gieser, H.
Groeseneken, G.
Mettler, S.
Morena, E.
Qu, N.
Soppa, W.
Stadler, W.
Stella, R.
Wilkening, W.
Wolf , H.
Zullino, L.
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Date
2003
Type
  • Conference Paper
Publication status
published
External links
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Book title
Electrical Overstress/Electrostatic Discharge Symposium proceedings 2003
Publisher
ESD Association
Event
Electrical Overstress/Electrostatic Discharge Symposium, 2003, Las Vegas, NV, USA, September 21-25, 2003
Organisational unit
03228 - Fichtner, Wolfgang  
Notes
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no
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