Measurement of the x-ray dose-dependent glass temperature of structured polymer films by x-ray diffraction
Keymeulen, Heilke R.
Solak, Harun H.
Patterson, Bruce D.
Veen, Johannes F. van der
Stoykovich, Mark P.
Nealey, Paul F.
- Journal Article
Journal / seriesJournal of Applied Physics
Pages / Article No.
PublisherAmerican Institute of Physics
Subjectpolymer films; nanostructured materials; glass transition; X-ray diffraction; periodic structures; polymer structure
Organisational unit03562 - Van der Veen, Johannes
NotesReceived 14 January 2007, Accepted 29 May 2007, Published 12 July 2007.
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