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dc.contributor.author
Rudan M.
dc.contributor.author
Reggiani S.
dc.contributor.author
Gnani E.
dc.contributor.author
Baccarani G.
dc.contributor.author
Corvasce C.
dc.contributor.author
Barlini D.
dc.contributor.author
Ciappa M.
dc.contributor.author
Fichtner W.
dc.contributor.author
Denison M.
dc.contributor.author
Jensen N.
dc.contributor.author
Stecher M.
dc.contributor.author
Groos G.
dc.date.accessioned
2017-06-11T13:41:38Z
dc.date.available
2017-06-11T13:41:38Z
dc.date.issued
2005
dc.identifier.other
10.1109/ESSDER.2005.1546711
dc.identifier.uri
http://hdl.handle.net/20.500.11850/92264
dc.language.iso
en
dc.publisher
IEEE
dc.subject
Hall effect
dc.subject
semiconductor device models
dc.title
Experimental Validation of a New Analytical Model for the Position-Dependent Hall Voltage in Semiconductor Devices
dc.type
Other Conference Item
ethz.book.title
Solid-State Device Research Conference, 2005. ESSDERC 2005. Proceedings of 35th European
ethz.pages.start
565
ethz.pages.end
568
ethz.event
Solid-State Device Research Conference, 2005. ESSDERC 2005
ethz.event.date
12.-16. Sept. 2005
ethz.notes
.
ethz.publication.place
Grenoble
ethz.publication.status
published
ethz.leitzahl
03228 - Fichtner, Wolfgang
ethz.leitzahl.certified
03228 - Fichtner, Wolfgang
ethz.date.deposited
2017-06-11T13:41:54Z
ethz.source
ECIT
ethz.identifier.importid
imp5936528443f7777752
ethz.ecitpid
pub:145178
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-19T08:03:42Z
ethz.rosetta.lastUpdated
2017-07-19T08:03:42Z
ethz.rosetta.versionExported
true
ethz.COinS
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