Resolution and contrast in Kelvin probe force microscopy

Thumbnail
Metadata only
Author
Jacobs, H.O.
Leuchtmann, Pascal
Homan, O.J.
Stemmer, A.
Show all
Date
1998-08
Type
  • Journal Article
Publication status
published
External links
Full text via SFX
Journal / series
Journal of Applied Physics
Volume
84(3)
Pages
1168 - 1173
Publisher
American Institute of Physics
Organisational unit
03472 - Professur für Feldtheorie (ehemalig)
Notes
Received: 20 February 1997; Accepted for publication: 4 May 1998.
More
Show all metadata
Altmetrics