Resolution and contrast in Kelvin probe force microscopy

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Author
Jacobs, H.O.
Leuchtmann, Pascal
Homan, O.J.
Stemmer, A.
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Date
1998-08
Type
    Journal Article
Publication status
published
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Journal / series
Journal of Applied Physics
Volume
84(3)
Pages / Article No.
1168 - 1173
Publisher
American Institute of Physics
Organisational unit
03472 - Professur für Feldtheorie (ehemalig)  
Notes
Received: 20 February 1997; Accepted for publication: 4 May 1998.
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