Resolution and contrast in Kelvin probe force microscopy - Research Collection

Metadata only

Author

Jacobs, H.O.

Leuchtmann, Pascal

Homan, O.J.

Stemmer, A.

Date

1998-08

Type

Journal Article

Citations

Cited 362 times in Web of Science

ETH Bibliography

yes

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Publication status

published

External links

https://doi.org/10.1063/1.368181

Journal / series

Journal of Applied Physics

Volume

84(3)

Pages / Article No.

1168 - 1173

Publisher

American Institute of Physics

Organisational unit

03472 - Professur für Feldtheorie (ehemalig)

Notes

Received: 20 February 1997; Accepted for publication: 4 May 1998.

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Citations

Cited 362 times in Web of Science

ETH Bibliography

yes

Altmetrics