Resolution and contrast in Kelvin probe force microscopy
dc.contributor.author
Jacobs, H.O.
dc.contributor.author
Leuchtmann, Pascal
dc.contributor.author
Homan, O.J.
dc.contributor.author
Stemmer, A.
dc.date.accessioned
2017-06-11T13:46:33Z
dc.date.available
2017-06-11T13:46:33Z
dc.date.issued
1998-08
dc.identifier.issn
0021-8979
dc.identifier.issn
1089-7550
dc.identifier.other
10.1063/1.368181
dc.identifier.uri
http://hdl.handle.net/20.500.11850/92451
dc.language.iso
en
dc.publisher
American Institute of Physics
dc.title
Resolution and contrast in Kelvin probe force microscopy
dc.type
Journal Article
ethz.journal.title
Journal of Applied Physics
ethz.journal.volume
84
ethz.journal.issue
3
ethz.journal.abbreviated
J. Appl. Physi.
ethz.pages.start
1168
ethz.pages.end
1173
ethz.notes
Received: 20 February 1997; Accepted for publication: 4 May 1998.
ethz.identifier.nebis
000037502
ethz.publication.place
Melville, NY
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich, direkt::00012 - Lehre und Forschung, direkt::00007 - Departemente, direkt::02140 - Departement Informationstechnologie und Elektrotechnik / Department of Information Technology and Electrical Engineering::02635 - Institut für Elektromagnetische Felder (IEF) / Electromagnetic Fields Laboratory (IEF)::03472 - Professur für Feldtheorie (ehemalig)
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich, direkt::00012 - Lehre und Forschung, direkt::00007 - Departemente, direkt::02140 - Departement Informationstechnologie und Elektrotechnik / Department of Information Technology and Electrical Engineering::02635 - Institut für Elektromagnetische Felder (IEF) / Electromagnetic Fields Laboratory (IEF)::03472 - Professur für Feldtheorie (ehemalig)
ethz.date.deposited
2017-06-11T13:46:49Z
ethz.source
ECIT
ethz.identifier.importid
imp59365287cd99839687
ethz.ecitpid
pub:145516
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-12T10:43:06Z
ethz.rosetta.lastUpdated
2021-02-14T12:17:04Z
ethz.rosetta.versionExported
true
ethz.COinS
ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.atitle=Resolution%20and%20contrast%20in%20Kelvin%20probe%20force%20microscopy&rft.jtitle=Journal%20of%20Applied%20Physics&rft.date=1998-08&rft.volume=84&rft.issue=3&rft.spage=1168&rft.epage=1173&rft.issn=0021-8979&1089-7550&rft.au=Jacobs,%20H.O.&Leuchtmann,%20Pascal&Homan,%20O.J.&Stemmer,%20A.&rft.genre=article&rft_id=info:doi/10.1063/1.368181&
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