An Optimal Policy for Target Localization with Application to Electron Microscopy

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Author
Sznitman, Raphael
Lucchi, Aurélien
Frazier, Peter I.
Jedynak, Bruno M.
Fua, Pascal
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Date
2013
Type
  • Conference Paper
Publication status
published
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Editor
Dasgupta, Sanjoy
McAllester, David
Book title
Proceedings of the 30th International Conference on Machine Learning
Journal / series
JMLR Workshop and Conference Proceedings
Volume
28(1)
Pages / Article No.
1 - 9
Publisher
Curran
Event
International Conference on Machine Learning (ICML 2013), Atlanta, Georgia, USA, June 16-21, 2013
Organisational unit
09462 - Hofmann, Thomas / Hofmann, Thomas  
Notes
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