An Optimal Policy for Target Localization with Application to Electron Microscopy

Thumbnail
Metadata only
Author
Sznitman, Raphael
Lucchi, Aurélien
Frazier, Peter I.
Jedynak, Bruno M.
Fua, Pascal
Show all
Date
2013
Type
  • Conference Paper
Publication status
published
External links
Search via SFX
Editor
Dasgupta, Sanjoy
McAllester, David
Book title
Proceedings of the 30th International Conference on Machine Learning
Journal / series
JMLR Workshop and Conference Proceedings
Volume
28(1)
Pages / Article No.
1 - 9
Publisher
Curran
Event
International Conference on Machine Learning (ICML 2013), Atlanta, Georgia, USA, June 16-21, 2013
Organisational unit
09462 - Hofmann, Thomas  
Notes
.
More
Show all metadata
ETH Bibliography
no
Altmetrics