An Optimal Policy for Target Localization with Application to Electron Microscopy

Metadata only

Author

Sznitman, Raphael

Lucchi, Aurélien

Frazier, Peter I.

Jedynak, Bruno M.

Fua, Pascal

Date

2013

Type

Altmetrics

Publication status

published

External links

Editor

Dasgupta, Sanjoy

McAllester, David

Book title

Proceedings of the 30th International Conference on Machine Learning

Journal / series

JMLR Workshop and Conference Proceedings

Volume

28(1)

Pages

1 - 9

Publisher

Curran

Event

International Conference on Machine Learning (ICML 2013), Atlanta, Georgia, USA, June 16-21, 2013

Organisational unit

09462 - Hofmann, Thomas

Notes

.

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