An Optimal Policy for Target Localization with Application to Electron Microscopy

Metadata only

Author

Date

2013

Type

Conference Paper

ETH Bibliography

no

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Publication status

published

Editor

Book title

Proceedings of the 30th International Conference on Machine Learning

Journal / series

JMLR Workshop and Conference Proceedings

Volume

28(1)

Pages / Article No.

1 - 9

Publisher

Curran

Event

International Conference on Machine Learning (ICML 2013), Atlanta, Georgia, USA, June 16-21, 2013

Organisational unit

09462 - Hofmann, Thomas / Hofmann, Thomas

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ETH Bibliography

no

Altmetrics

Research Collection