Using a Deformation Field Model for Localizing Faces and Facial Points under Weak Supervision.

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Author

Date

2014

Type

Conference Paper

ETH Bibliography

yes

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Publication status

published

External links

Book title

2014 IEEE Conference on Computer Vision and Pattern Recognition Workshops (CVPRW 2014)

Pages / Article No.

3694 - 3701

Publisher

IEEE

Event

IEEE Conference on Computer Vision and Pattern Recognition Workshops (CVPRW 2014), Columbus, OH, USA, June 23-28, 2014

Organisational unit

03514 - Van Gool, Luc / Van Gool, Luc

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ETH Bibliography

yes

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Research Collection