Using a Deformation Field Model for Localizing Faces and Facial Points under Weak Supervision.
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Date
2014Type
- Conference Paper
ETH Bibliography
yes
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Publication status
publishedExternal links
Book title
2014 IEEE Conference on Computer Vision and Pattern Recognition Workshops (CVPRW 2014)Pages / Article No.
Publisher
IEEEEvent
Organisational unit
03514 - Van Gool, Luc / Van Gool, Luc
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ETH Bibliography
yes
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