Excess carrier lifetimes in Ge layers on Si

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Author
Geiger, R.
Frigerio, J.
Süess, M.J.
Chrastina, D.
Isella, G.
Spolenak, R.
Faist, Jérôme
Sigg, H.
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Date
2014
Type
  • Journal Article
Publication status
published
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Journal / series
Applied Physics Letters
Volume
104(6)
Pages
062106
Publisher
American Institute of Physics
Organisational unit
03759 - Faist, Jérôme
Notes
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Citations
Cited 33 times in Web of Science
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