Excess carrier lifetimes in Ge layers on Si - Research Collection

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Author

Geiger, R.

Frigerio, J.

Süess, M.J.

Chrastina, D.

Isella, G.

Spolenak, R.

Faist, Jérôme

Sigg, H.

Date

2014

Type

Journal Article

Citations

Cited 34 times in Web of Science

ETH Bibliography

yes

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Publication status

published

External links

https://doi.org/10.1063/1.4865237

Journal / series

Applied Physics Letters

Volume

104(6)

Pages / Article No.

062106

Publisher

American Institute of Physics

Organisational unit

03759 - Faist, Jérôme / Faist, Jérôme

Notes

.

More

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Citations

Cited 34 times in Web of Science

ETH Bibliography

yes

Altmetrics