Multi-frequency atomic force microscopy: A system-theoretic approach

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Autor(in)

Datum

2014-09

Typ

Conference Paper

ETH Bibliographie

yes

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Publikationsstatus

published

Externe Links

Zeitschrift / Serie

IFAC Proceedings Volumes

Band

47(3)

Seiten / Artikelnummer

7499 - 7504

Verlag

Elsevier

Konferenz

19th World Congress of the International Federation of Automatic Control (IFAC 2014), Cape Town, South Africa, August 24-29, 2014

Thema

Atomic force microscopy; MF-AFM; System identification; Cantilever dynamics

Organisationseinheit

03627 - Nelson, Bradley J. / Nelson, Bradley J.

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ETH Bibliographie

yes

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Research Collection