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dc.contributor.author
Menges, Fabian
dc.contributor.author
Mensch, Philipp
dc.contributor.author
Karg, Siegfried
dc.contributor.author
Stemmer, Andreas
dc.contributor.author
Riel, Heike
dc.contributor.author
Gotsmann, Bernd
dc.date.accessioned
2017-06-11T15:35:22Z
dc.date.available
2017-06-11T15:35:22Z
dc.date.issued
2014
dc.identifier.isbn
978-2-9539515-9-2
dc.identifier.uri
http://hdl.handle.net/20.500.11850/96628
dc.language.iso
en
dc.publisher
CETHIL
dc.subject
Scanning thermal microscopy
dc.subject
Self-heating
dc.subject
Nanoscale hot spots
dc.subject
Hermometry
dc.subject
Nanowire
dc.title
Nanoscale thermometry using scanning thermal microscopy
dc.type
Other Conference Item
ethz.book.title
Eurotherm 103: Nanoscale and Microscale Heat Transfer IV, October 15-17, 2014, Lyon, France. Book of Abstracts
ethz.pages.start
9
ethz.pages.end
11
ethz.event
Eurotherm 103: Nanoscale and Microscale Heat Transfer IV (NMHT IV)
ethz.event.location
Lyon, France
ethz.event.date
October 15-17, 2014
ethz.notes
.
ethz.publication.place
Villeurbanne
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::03444 - Stemmer, Andreas / Stemmer, Andreas
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.::03444 - Stemmer, Andreas / Stemmer, Andreas
ethz.date.deposited
2017-06-11T15:35:51Z
ethz.source
ECIT
ethz.identifier.importid
imp593652d40e5f058479
ethz.ecitpid
pub:151307
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-14T20:07:23Z
ethz.rosetta.lastUpdated
2018-11-02T17:57:46Z
ethz.rosetta.versionExported
true
ethz.COinS
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