Wafer-level flame-spray pyrolysis deposition of gas-sensitive layers on microsensors
Abstract
This paper presents a CMOS-compatible wafer-level fabrication process for monolithic CMOS/MEMS sensor systems coated with sensitive layers directly deposited by means of flame spray pyrolysis (FSP). Microhotplate (µHP)-based devices, featuring an FSP directly deposited SnO2/Pt layer, have successfully been realized on a wafer level. The thermal characterization evidenced a thermal resistance of 10.6 °C mW−1; moreover, gas test measurements with ethanol have been performed. Microhotplate membrane deformations during device operation have been investigated and have been reduced by adjustment of the intrinsic stress of a deposited silicon nitride layer. Show more
Publication status
publishedExternal links
Journal / series
Journal of Micromechanics and MicroengineeringVolume
Pages / Article No.
Publisher
IOP PublishingOrganisational unit
03684 - Hierlemann, Andreas / Hierlemann, Andreas
03510 - Pratsinis, Sotiris E. / Pratsinis, Sotiris E.
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