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dc.contributor.author
Lobsiger, Yanick
dc.contributor.author
Kolar, Johann W.
dc.date.accessioned
2017-10-05T11:59:14Z
dc.date.available
2017-06-11T16:08:32Z
dc.date.available
2017-10-05T11:52:39Z
dc.date.available
2017-10-05T11:59:14Z
dc.date.issued
2015-06
dc.identifier.issn
0885-8993
dc.identifier.issn
1941-0107
dc.identifier.other
10.1109/TPEL.2014.2332811
en_US
dc.identifier.uri
http://hdl.handle.net/20.500.11850/98121
dc.language.iso
en
en_US
dc.publisher
IEEE
en_US
dc.title
Closed-Loop di/dt and dv/dt IGBT Gate Driver
en_US
dc.type
Journal Article
ethz.journal.title
IEEE Transactions on Power Electronics
ethz.journal.volume
30
en_US
ethz.journal.issue
6
en_US
ethz.journal.abbreviated
IEEE trans. power electron.
ethz.pages.start
3402
en_US
ethz.pages.end
3417
en_US
ethz.notes
.
en_US
ethz.identifier.wos
ethz.identifier.scopus
ethz.identifier.nebis
000033980
ethz.publication.place
New York, NY
en_US
ethz.publication.status
published
en_US
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::03573 - Kolar, Johann W. / Kolar, Johann W.
en_US
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.::03573 - Kolar, Johann W. / Kolar, Johann W.
ethz.date.deposited
2017-06-11T16:08:52Z
ethz.source
ECIT
ethz.identifier.importid
imp593652edd8e5735259
ethz.ecitpid
pub:153423
ethz.eth
yes
en_US
ethz.availability
Metadata only
en_US
ethz.rosetta.installDate
2017-07-18T08:28:19Z
ethz.rosetta.lastUpdated
2017-10-05T11:59:16Z
ethz.rosetta.versionExported
true
ethz.COinS
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