Show simple item record

dc.contributor.author
Mai, A.
dc.contributor.author
Zhu, L.
dc.contributor.author
Hecker, M.
dc.contributor.author
Rinderknecht, J.
dc.contributor.author
Georgi, C.
dc.contributor.author
Ritz, Y.
dc.contributor.author
Zschech, E.
dc.date.accessioned
2017-06-08T19:05:55Z
dc.date.available
2017-06-08T19:05:55Z
dc.date.issued
2008
dc.identifier.issn
0377-0486
dc.identifier.issn
1097-4555
dc.identifier.other
10.1002/jrs.1852
dc.identifier.uri
http://hdl.handle.net/20.500.11850/9916
dc.language.iso
en
dc.publisher
Wiley
dc.subject
Raman spectroscopy
dc.subject
aperture
dc.subject
strain
dc.subject
silicon - germanium
dc.title
Aperture based Raman spectroscopy on SiGe film structures with high spatial resolution
dc.type
Journal Article
ethz.journal.title
Journal of Raman Spectroscopy
ethz.journal.volume
39
ethz.journal.issue
4
ethz.journal.abbreviated
J. Raman Spectrosc.
ethz.pages.start
435
ethz.pages.end
438
ethz.notes
Received: 5 July 2007, Accepted: 14 September 2007.
ethz.identifier.wos
ethz.identifier.nebis
000027994
ethz.publication.place
Chichester
ethz.publication.status
published
ethz.leitzahl
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02020 - Dep. Chemie und Angewandte Biowiss. / Dep. of Chemistry and Applied Biosc.::02514 - Laboratorium für Organische Chemie / Laboratory of Organic Chemistry::03430 - Zenobi, Renato / Zenobi, Renato
ethz.leitzahl.certified
ETH Zürich::00002 - ETH Zürich::00012 - Lehre und Forschung::00007 - Departemente::02020 - Dep. Chemie und Angewandte Biowiss. / Dep. of Chemistry and Applied Biosc.::02514 - Laboratorium für Organische Chemie / Laboratory of Organic Chemistry::03430 - Zenobi, Renato / Zenobi, Renato
ethz.date.deposited
2017-06-08T19:06:03Z
ethz.source
ECIT
ethz.identifier.importid
imp59364be5076cc95742
ethz.ecitpid
pub:20880
ethz.eth
yes
ethz.availability
Metadata only
ethz.rosetta.installDate
2017-07-25T18:33:48Z
ethz.rosetta.lastUpdated
2018-10-01T05:41:33Z
ethz.rosetta.exportRequired
true
ethz.rosetta.versionExported
true
ethz.COinS
ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.atitle=Aperture%20based%20Raman%20spectroscopy%20on%20SiGe%20film%20structures%20with%20high%20spatial%20resolution&rft.jtitle=Journal%20of%20Raman%20Spectroscopy&rft.date=2008&rft.volume=39&rft.issue=4&rft.spage=435&rft.epage=438&rft.issn=0377-0486&1097-4555&rft.au=Mai,%20A.&Zhu,%20L.&Hecker,%20M.&Rinderknecht,%20J.&Georgi,%20C.&rft.genre=article&rft_id=info:doi/10.1002/jrs.1852&
 Search print copy at ETH Library

Files in this item

FilesSizeFormatOpen in viewer

There are no files associated with this item.

Publication type

Show simple item record