Finding the detour-critical edge of a shortest path between two nodes
Metadata only
Date
1998-07Type
- Journal Article
Altmetrics
Publication status
publishedJournal / series
Information processing lettersVolume
Pages
Publisher
ElsevierSubject
Shortest path; Fault tolerance; Transient edge failures; Longest detour; Most critical edgeOrganisational unit
03340 - Widmayer, Peter
Notes
Published online 21 October 1998.More
Show all metadata
Altmetrics