Finding the detour-critical edge of a shortest path between two nodes
Metadata only
Date
1998-07Type
- Journal Article
Publication status
publishedExternal links
Journal / series
Information Processing LettersVolume
Pages / Article No.
Publisher
ElsevierSubject
Shortest path; Fault tolerance; Transient edge failures; Longest detour; Most critical edgeOrganisational unit
03340 - Widmayer, Peter / Widmayer, Peter
Notes
Published online 21 October 1998.More
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