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Journal of electronic testing: theory and applications
Journal:
Journal of electronic testing: theory and applications
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Abbreviation
J. electron. test.
Publisher
Springer
Journal Volumes
ISSN
0923-8174
1573-0727
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Bacivarov, Iuliana
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Schor, Lars
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Thiele, Lothar
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Yang, Hoeseok
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2013
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Efficient Worst-Case Temperature Evaluation for Thermal-Aware Assignment of Real-Time Applications on MPSoCs
Item type:
Journal Article
Schor, Lars
;
Bacivarov, Iuliana
;
Yang, Hoeseok
; et al.
(
2013
)
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Journal of electronic testing: theory and applications
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