Measuring the Vibrational Density of States of Nanocrystal-Based Thin Films with Inelastic X-ray Scattering
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Author / Producer
Date
2018-04-05
Publication Type
Journal Article
ETH Bibliography
yes
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Rights / License
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Publication status
published
External links
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Book title
Journal / series
Volume
9 (7)
Pages / Article No.
1561 - 1567
Publisher
American Chemical Society
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Edition / version
Methods
Software
Geographic location
Date collected
Date created
Subject
Organisational unit
03895 - Wood, Vanessa / Wood, Vanessa
02140 - Dep. Inf.technologie und Elektrotechnik / Dep. of Inform.Technol. Electrical Eng.