Photo-ASICs
integrated optical metrology systems with industrial CMOS technology
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Author / Producer
Date
1993
Publication Type
Doctoral Thesis
ETH Bibliography
yes
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published
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Contributors
Examiner : Baltes, Heinrich P.
Examiner : Seitz, Peter
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Publisher
ETH Zürich
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Subject
OPTOELEKTRONISCHE BAUELEMENTE + PHOTOELEKTRONISCHE BAUELEMENTE (OPTOELEKTRONIK); PHOTODETEKTOREN (OPTOELEKTRONIK); ANWENDUNGSSPEZIFISCHE INTEGRIERTE SCHALTUNGEN, ASICS (MIKROELEKTRONIK); KOMPLEMENTÄRE METALLOXID-HALBLEITERSCHALTUNGEN, CMOS (MIKROELEKTRONIK); PHOTODIODEN (OPTOELEKTRONIK); LADUNGSGEKOPPELTE BAUELEMENTE, CCD (ELEKTRONIK); OPTOELECTRONIC DEVICES + PHOTOELECTRONIC DEVICES (OPTOELECTRONICS); PHOTO DETECTORS (OPTOELECTRONICS); APPLICATION SPECIFIC INTEGRATED CIRCUITS, ASICS (MICROELECTRONICS); COMPLEMENTARY-METAL-OXIDE-SEMICONDUCTOR CIRCUITS, CMOS (MICROELECTRONICS); PHOTODIODES (OPTOELECTRONICS); CHARGE-COUPLED DEVICES, CCD (ELECTRONICS)
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Notes
Diss. Naturwiss. ETH Zürich, Nr. 10186, 1993. Ref.: H. Baltes ; Korref.: P. Seitz.