High-resolution Kelvin probe force microscopy of active nanoelectronic devices
Loading...
Author / Producer
Date
2016
Publication Type
Doctoral Thesis
ETH Bibliography
yes
Citations
Altmetric
Data
Rights / License
Permanent link
Publication status
published
External links
Editor
Contributors
Examiner : Stemmer, Andreas
Examiner : Gotsmann, Bernd
Book title
Journal / series
Volume
Pages / Article No.
Publisher
ETH Zurich
Event
Edition / version
Methods
Software
Geographic location
Date collected
Date created
Subject
ATOMIC FORCE MICROSCOPES, AFM + ATOMIC FORCE MICROSCOPY; NANOELEKTRONIK; NANOSTRUKTURIERTE MATERIALIEN (PHYSIK DER KONDENSIERTEN MATERIE); NANOELECTRONICS; NANOSTRUCTURED MATERIALS (CONDENSED MATTER PHYSICS); RASTERKRAFTMIKROSKOPE, RKM + RASTERKRAFTMIKROSKOPIE
Organisational unit
03444 - Stemmer, Andreas (emeritus) / Stemmer, Andreas (emeritus)
02130 - Dep. Maschinenbau und Verfahrenstechnik / Dep. of Mechanical and Process Eng.