Size effects on yield strength and strain hardening for ultra-thin Cu films with and without passivation
A study by synchrotron and bulge test techniques
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Author / Producer
Date
2008
Publication Type
Journal Article
ETH Bibliography
yes
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Rights / License
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Publication status
published
External links
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Book title
Journal / series
Volume
56 (10)
Pages / Article No.
2318 - 2335
Publisher
Elsevier
Event
Edition / version
Methods
Software
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Date collected
Date created
Subject
Thin films; Plastic deformation; Tension test; X-ray diffraction (XRD); Synchrotron radiation
Organisational unit
03692 - Spolenak, Ralph / Spolenak, Ralph
Notes
Received 24 August 2007. revised 19 December 2007. accepted 15 January 2008. available online 7 March 2008.