Measurement of the transient junction temperature in MOSFET devices under operating conditions
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Author / Producer
Date
2007
Publication Type
Conference Paper
ETH Bibliography
yes
Citations
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Rights / License
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Publication status
published
Editor
Book title
Journal / series
Volume
47 (9-11)
Pages / Article No.
1707 - 1712
Publisher
Elsevier
Event
18th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
Edition / version
Methods
Software
Geographic location
Date collected
Date created
Subject
Organisational unit
03228 - Fichtner, Wolfgang (emeritus)
Notes
Received 3 July 2007. Available online 28 August 2007..