Stable branched electron flow
OPEN ACCESS
Author / Producer
Date
2018-07
Publication Type
Journal Article
ETH Bibliography
yes
Citations
Altmetric
OPEN ACCESS
Data
Rights / License
Abstract
The pattern of branched electron flow revealed by scanning gate microscopy shows the distribution of ballistic electron trajectories. The details of the pattern are determined by the correlated potential of remote dopants with an amplitude far below the Fermi energy. We find that the pattern persists even if the electron density is significantly reduced such that the change in Fermi energy exceeds the background potential amplitude. The branch pattern is robust against changes in charge carrier density, but not against changes in the background potential caused by additional illumination of the sample.
Permanent link
Publication status
published
External links
Editor
Book title
Journal / series
Volume
20
Pages / Article No.
73015
Publisher
IOP Publishing
Event
Edition / version
Methods
Software
Geographic location
Date collected
Date created
Subject
quantum transport; scanning gate microscopy; branched electron flow; mesoscopic; local perturbation; trajectory simulation
Organisational unit
03833 - Wegscheider, Werner / Wegscheider, Werner
03439 - Ensslin, Klaus / Ensslin, Klaus
02205 - FIRST-Lab / FIRST Center for Micro- and Nanoscience
08835 - Ihn, Thomas (Tit.-Prof.)