Serialize TID Numbers
A Headache or a Blessing for RFID Crackers?
METADATA ONLY
Loading...
Author / Producer
Date
2009-04
Publication Type
Conference Paper
ETH Bibliography
yes
Citations
Altmetric
METADATA ONLY
Data
Rights / License
Permanent link
Publication status
published
External links
Editor
Book title
IEEE International Conference on RFID, 2009 : 27 - 28 April 2009, Orlando, Florida, USA
Journal / series
Volume
Pages / Article No.
233 - 240
Publisher
IEEE
Event
2009 IEEE International Conference on RFID
Edition / version
Methods
Software
Geographic location
Date collected
Date created
Subject
Organisational unit
Notes
Current Version Published 07 Mai 2009.