Thomas Michlmayr


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Michlmayr

First Name

Thomas

ORCID

0000-0001-7120-2337

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2019 - 201912020 - 20215
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Publications 1 - 6 of 6
  • Low-temperature scanning field emission microscope with polarization analysis
    Item type: Conference Paper
    Thamm, Ann-Katrin; Demydenko, Maksym; Michlmayr, Thomas; et al. (2020)
    2020 33rd International Vacuum Nanoelectronics Conference (IVNC)
    The design of the low-temperature scanning probe microscope, which works in field emission regime with spin polarization analysis, is proposed. A performance at temperature of 77 K has been achieved. The first result of STM imaging with atomic resolution is demonstrated. © 2020 IEEE.
  • Compact setup for spin-, time-, and angle-resolved photoemission spectroscopy
    Item type: Journal Article
    Bühlmann, Kevin; Gort, Rafael; Fognini, Andreas; et al. (2020)
    Review of Scientific Instruments
    We present a compact setup for spin-, time-, and angle-resolved photoemission spectroscopy. A 10 kHz titanium sapphire laser system delivers pulses of 20 fs duration, which drive a high harmonic generation-based source for ultraviolet photons at 21 eV for photoemission. The same laser also excites the sample for pump-probe experiments. Emitted electrons pass through a hemispherical energy analyzer and a spin-filtering element. The latter is based on spin-polarized low-energy electron diffraction on an Au-passivated iridium crystal. The performance of the measurement system is discussed in terms of the resolution and efficiency of the spin filter, which are higher than those for Mott-based techniques.
  • Improving the Detection and the Analysis of Energy Filtered and Spin Polarised Electrons with the implementation of a Miniature Energy Analyser
    Item type: Conference Paper
    Bellissimo, Alessandra; Walker, C. G. H.; Bähler, Thomas; et al. (2020)
    2020 33rd International Vacuum Nanoelectronics Conference (IVNC)
    With the aim of improving detection and analysis of energy filtered electrons in the Scanning Field-Emission Microscope (SFEM) and of the spin polarised electrons in the SFEM with Polarisation Analysis (SFEMPA) tests are performed on a miniature electron detection unit employing a Bessel Box energy analyser. Even in conventional electron microscopes, the detection of low-energy electrons (with kinetic energies of the order of 100eV or lower) is inherently difficult due to the presence of electrostatic (and magnetic) fields in proximity of the beam-target interaction region, inhibiting the escape of these electrons and complicating the interpretation of their detected signal. The reduced dimensions of such a compact energy analyser - with a length of 1&1/2 channeltrons - consent its employment close to the sample surface, thus minimising the aforementioned fields effects. Experimental results demonstrating the capability of this analyser to collect electron spectra are discussed. © 2020 IEEE.
  • Development of a Low-Temperature Scanning Field Emission Microscope with Spin Polarization Analysis
    Item type: Conference Poster
    Thamm, Ann-Katrin; Michlmayr, Thomas; Ramsperger, Urs; et al. (2019)
    Online Abstracts: Joint Annual Meeting of SPS and APS
  • Electron energy analysis in Scanning Field Emission Microscopy using a Bessel box energy analyzer
    Item type: Conference Paper
    Bodik, Michal; Demydenko, Maksym; Walker, Chris G.H.; et al. (2021)
    In this study, we use Scanning Field Emission Microscopy (SFEM) combined with a miniature electron energy analyzer known as a Bessel box to measure electron energy spectra emitted from a sample. Previous studies using SFEM have revealed that the work function (ϕ) of the material under study has a significant role to play in the formation of the signal intensity. Hence, in order to understand the role of ϕ in greater detail, a sample of W(110) (ϕ = 5.25 eV) and a sample of Cs deposited on W(110) (ϕ ≈ 1.7 eV) were investigated. STM images show that the Cs covered surface has a speckled appearance indicating small Cs islands. The electron energy loss spectra obtained (which are the first using the Bessel box in SFEM) show differing structure in the elastic peak region. Monte Carlo (MC) simulations including quantum mechanical "bouncing" have been carried out. The results are consistent with MC simulations of the electrons escaping from the tip-sample junction.
  • Scanning Field Emission Microscopy using a miniature Bessel box electron energy analyser
    Item type: Other Conference Item
    Bodik, Michal; Demydenko, Maksym; Walker, Christopher; et al. (2021)
    Proceedings of the Microscience Microscopy Congress 2021 incorporating EMAG 2021
Publications 1 - 6 of 6