Aperture based Raman spectroscopy on SiGe film structures with high spatial resolution
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Author / Producer
Date
2008
Publication Type
Journal Article
ETH Bibliography
yes
Citations
Altmetric
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Rights / License
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Publication status
published
External links
Editor
Book title
Journal / series
Volume
39 (4)
Pages / Article No.
435 - 438
Publisher
Wiley
Event
Edition / version
Methods
Software
Geographic location
Date collected
Date created
Subject
Raman spectroscopy; aperture; strain; silicon - germanium
Organisational unit
03430 - Zenobi, Renato / Zenobi, Renato
Notes
Received: 5 July 2007, Accepted: 14 September 2007.