High frequency atomic force microscopy
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Author / Producer
Date
2011
Publication Type
Doctoral Thesis
ETH Bibliography
yes
Citations
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Rights / License
Permanent link
Publication status
published
External links
Editor
Contributors
Examiner : Stemmer, Andreas
Examiner : Duerig, Urs
Book title
Journal / series
Volume
Pages / Article No.
Publisher
ETH Zurich
Event
Edition / version
Methods
Software
Geographic location
Date collected
Date created
Subject
ATOMIC FORCE MICROSCOPES, AFM + ATOMIC FORCE MICROSCOPY; OPTOELEKTRONIK + PHOTOELEKTRONIK; HEURISTIC METHODS (OPERATIONS RESEARCH); HEURISTISCHE METHODEN (OPERATIONS RESEARCH); ELASTOMECHANIK; ELASTOMECHANICS; OPTOELECTRONICS + PHOTOELECTRONICS; RASTERKRAFTMIKROSKOPE, RKM + RASTERKRAFTMIKROSKOPIE
Organisational unit
03444 - Stemmer, Andreas (emeritus) / Stemmer, Andreas (emeritus)