Analogieverfahren für die Bestimmung elektromagnetischer Wechselfelder in Leitern und Halbleitern
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Author / Producer
Date
1961
Publication Type
Doctoral Thesis
ETH Bibliography
yes
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Publication status
published
External links
Editor
Contributors
Examiner : Speiser, Ambros P.
Examiner : Strutt, Maximilian J. O.
Book title
Journal / series
Volume
Pages / Article No.
Publisher
ETH Zürich
Event
Edition / version
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Date collected
Date created
Subject
SPANNUNGSMESSUNG (ELEKTRISCHE MESSTECHNIK); WECHSELFELDER (ELEKTROTECHNIK); HALBLEITERMATERIALIEN (ELEKTROTECHNIK); METALLLEITER (ELEKTROTECHNIK); HALBLEITER + HALBLEITERTECHNOLOGIE (ELEKTROTECHNIK); LEITERMATERIALIEN (ELEKTROTECHNIK); VOLTAGE MEASUREMENT (ELECTRICAL MEASUREMENT TECHNIQUE); ALTERNATING FIELDS (ELECTRICAL ENGINEERING); SEMICONDUCTOR MATERIALS (ELECTRICAL ENGINEERING); METALLIC CONDUCTORS (ELECTRICAL ENGINEERING); SEMICONDUCTORS + SEMICONDUCTOR TECHNOLOGY (ELECTRICAL ENGINEERING); CONDUCTOR MATERIALS (ELECTRICAL ENGINEERING)
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Notes
Diss. Techn.Wiss. ETH Zürich, Nr. 3131, 0000. Ref.: Strutt, M. ; Korref.: Speiser, A.P..